Effort-aware just-in-time defect identification in practice: A case study at Alibaba
Effort-aware Just-in-Time (JIT) defect identification aims at identifying defect-introducing changes just-in-time with limited code inspection effort. Such identification has two benefits compared with traditional module-level defect identification, i.e., identifying defects in a more cost-effective...
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Main Authors: | YAN, Meng, XIA, Xin, FAN, Yuanrui, LO, David, HASSAN, Ahmed E., ZHANG, Xindong |
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Format: | text |
Language: | English |
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Institutional Knowledge at Singapore Management University
2020
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Online Access: | https://ink.library.smu.edu.sg/sis_research/5629 https://ink.library.smu.edu.sg/context/sis_research/article/6632/viewcontent/Effort_aware_JIT_Alibaba_pv.pdf |
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Institution: | Singapore Management University |
Language: | English |
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