Development programs for one-shot systems using multiplestate design reliability models

• Main Authors: Shevasuthisilp S., Vardeman S.B.
• Format: Article
• Language: English
• Published: 2014
• Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-4444290487&partnerID=40&md5=713bd70b786c11c68adefbea9ca5935c; http://cmuir.cmu.ac.th/handle/6653943832/1596
• Institution: Chiang Mai University

Design reliability at the beginning of a product development program is typically low, and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple-state reliability models. Dynamic programming is used to identify a best test-and-redesign strategy and is shown to be presently computationally feasible for at least 5-state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability change. © 2004 Wiley Periodicals, Inc.