Development programs for one-shot systems using multiplestate design reliability models
Design reliability at the beginning of a product development program is typically low, and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first us...
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Main Authors: | Shevasuthisilp S., Vardeman S.B. |
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Format: | Article |
Language: | English |
Published: |
2014
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Online Access: | http://www.scopus.com/inward/record.url?eid=2-s2.0-4444290487&partnerID=40&md5=713bd70b786c11c68adefbea9ca5935c http://cmuir.cmu.ac.th/handle/6653943832/1596 |
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Institution: | Chiang Mai University |
Language: | English |
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