Development programs for one-shot systems using multiplestate design reliability models

• المؤلفون الرئيسيون: Shevasuthisilp S., Vardeman S.B.
• التنسيق: مقال
• اللغة: English
• منشور في: 2014
• الوصول للمادة أونلاين: http://www.scopus.com/inward/record.url?eid=2-s2.0-4444290487&partnerID=40&md5=713bd70b786c11c68adefbea9ca5935c; http://cmuir.cmu.ac.th/handle/6653943832/1596

Design reliability at the beginning of a product development program is typically low, and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first us...