Fabrication of 90° wall of {100} plane on (100) Si by NaOH solution via design of experiments

The experimental trials were conducted by design of experiments (DOE) technique to find an anisotropic wet etching condition that achieves 90° wall angle on silicon (100) orientation wafer. Three considered factors assigned to the DOE were NaOH concentration, solution temperature, and stirring speed...

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Main Authors: Chupong Pakpum, Nirut Pussadee
Format: Book Series
Published: 2018
Online Access:https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84898902835&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/45495
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Institution: Chiang Mai University
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spelling th-cmuir.6653943832-454952018-01-24T06:11:19Z Fabrication of 90° wall of {100} plane on (100) Si by NaOH solution via design of experiments Chupong Pakpum Nirut Pussadee The experimental trials were conducted by design of experiments (DOE) technique to find an anisotropic wet etching condition that achieves 90° wall angle on silicon (100) orientation wafer. Three considered factors assigned to the DOE were NaOH concentration, solution temperature, and stirring speed. The response aimed for this study was not only targeting at 90° wall but also providing highest etch rate. The experimental results showed that in order to fabricate the 90° wall angle, the best etching condition using was 30% wt NaOH concentration, 80°C solution temperature, and 300 rpm stirring speed. This condition gave an etch rate of 1245 nm/min with surface roughness (R a ) of 701.48 nm. © (2014) Trans Tech Publications, Switzerland. 2018-01-24T06:11:19Z 2018-01-24T06:11:19Z 2014-01-01 Book Series 10226680 2-s2.0-84898902835 10.4028/www.scientific.net/AMR.909.27 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84898902835&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/45495
institution Chiang Mai University
building Chiang Mai University Library
country Thailand
collection CMU Intellectual Repository
description The experimental trials were conducted by design of experiments (DOE) technique to find an anisotropic wet etching condition that achieves 90° wall angle on silicon (100) orientation wafer. Three considered factors assigned to the DOE were NaOH concentration, solution temperature, and stirring speed. The response aimed for this study was not only targeting at 90° wall but also providing highest etch rate. The experimental results showed that in order to fabricate the 90° wall angle, the best etching condition using was 30% wt NaOH concentration, 80°C solution temperature, and 300 rpm stirring speed. This condition gave an etch rate of 1245 nm/min with surface roughness (R a ) of 701.48 nm. © (2014) Trans Tech Publications, Switzerland.
format Book Series
author Chupong Pakpum
Nirut Pussadee
spellingShingle Chupong Pakpum
Nirut Pussadee
Fabrication of 90° wall of {100} plane on (100) Si by NaOH solution via design of experiments
author_facet Chupong Pakpum
Nirut Pussadee
author_sort Chupong Pakpum
title Fabrication of 90° wall of {100} plane on (100) Si by NaOH solution via design of experiments
title_short Fabrication of 90° wall of {100} plane on (100) Si by NaOH solution via design of experiments
title_full Fabrication of 90° wall of {100} plane on (100) Si by NaOH solution via design of experiments
title_fullStr Fabrication of 90° wall of {100} plane on (100) Si by NaOH solution via design of experiments
title_full_unstemmed Fabrication of 90° wall of {100} plane on (100) Si by NaOH solution via design of experiments
title_sort fabrication of 90° wall of {100} plane on (100) si by naoh solution via design of experiments
publishDate 2018
url https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84898902835&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/45495
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