Optical interferometric technique for induced strain ferroelectric loop study at low frequency

Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phas...

Full description

Saved in:
Bibliographic Details
Main Authors: Siripong Somwan, Khem Chirapatpimol, Apichart Limpichaipanit, Komsanti Chokethawai, Athipong Ngamjarurojana
Format: Book Series
Published: 2018
Online Access:https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84904052484&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/45596
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Chiang Mai University
Description
Summary:Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phase, which in turn leads to a change in the intensity of the interference pattern formed where the reference and probing beams recombine. In this work the electric field induced-strain was measured as a function of electric field (s-E loop) and polarization (s-P loop) of PbMg 1/3 Nb 2/3 O 3 (PMN) and 0.7PbMg 1/3 Nb 2/3 O 3 -0.3PbZr 0.52 Ti 0.48 O 3 (0.7PMN-0.3PZT) ceramics, which showed electrostrictive (quadratic shape curve) and piezoelectric (butterfly shape curve) behavior at various frequency (0.01-1Hz). © (2014) Trans Tech Publications, Switzerland.