Optical interferometric technique for induced strain ferroelectric loop study at low frequency

Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phas...

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Bibliographic Details
Main Authors: Siripong Somwan, Khem Chirapatpimol, Apichart Limpichaipanit, Komsanti Chokethawai, Athipong Ngamjarurojana
Format: Book Series
Published: 2018
Online Access:https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84904052484&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/45596
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Institution: Chiang Mai University

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