Optical interferometric technique for induced strain ferroelectric loop study at low frequency
Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phas...
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th-cmuir.6653943832-455962018-01-24T06:12:47Z Optical interferometric technique for induced strain ferroelectric loop study at low frequency Siripong Somwan Khem Chirapatpimol Apichart Limpichaipanit Komsanti Chokethawai Athipong Ngamjarurojana Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phase, which in turn leads to a change in the intensity of the interference pattern formed where the reference and probing beams recombine. In this work the electric field induced-strain was measured as a function of electric field (s-E loop) and polarization (s-P loop) of PbMg 1/3 Nb 2/3 O 3 (PMN) and 0.7PbMg 1/3 Nb 2/3 O 3 -0.3PbZr 0.52 Ti 0.48 O 3 (0.7PMN-0.3PZT) ceramics, which showed electrostrictive (quadratic shape curve) and piezoelectric (butterfly shape curve) behavior at various frequency (0.01-1Hz). © (2014) Trans Tech Publications, Switzerland. 2018-01-24T06:12:47Z 2018-01-24T06:12:47Z 2014-01-01 Book Series 16628985 10226680 2-s2.0-84904052484 10.4028/www.scientific.net/AMR.936.110 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84904052484&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/45596 |
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Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phase, which in turn leads to a change in the intensity of the interference pattern formed where the reference and probing beams recombine. In this work the electric field induced-strain was measured as a function of electric field (s-E loop) and polarization (s-P loop) of PbMg 1/3 Nb 2/3 O 3 (PMN) and 0.7PbMg 1/3 Nb 2/3 O 3 -0.3PbZr 0.52 Ti 0.48 O 3 (0.7PMN-0.3PZT) ceramics, which showed electrostrictive (quadratic shape curve) and piezoelectric (butterfly shape curve) behavior at various frequency (0.01-1Hz). © (2014) Trans Tech Publications, Switzerland. |
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Book Series |
author |
Siripong Somwan Khem Chirapatpimol Apichart Limpichaipanit Komsanti Chokethawai Athipong Ngamjarurojana |
spellingShingle |
Siripong Somwan Khem Chirapatpimol Apichart Limpichaipanit Komsanti Chokethawai Athipong Ngamjarurojana Optical interferometric technique for induced strain ferroelectric loop study at low frequency |
author_facet |
Siripong Somwan Khem Chirapatpimol Apichart Limpichaipanit Komsanti Chokethawai Athipong Ngamjarurojana |
author_sort |
Siripong Somwan |
title |
Optical interferometric technique for induced strain ferroelectric loop study at low frequency |
title_short |
Optical interferometric technique for induced strain ferroelectric loop study at low frequency |
title_full |
Optical interferometric technique for induced strain ferroelectric loop study at low frequency |
title_fullStr |
Optical interferometric technique for induced strain ferroelectric loop study at low frequency |
title_full_unstemmed |
Optical interferometric technique for induced strain ferroelectric loop study at low frequency |
title_sort |
optical interferometric technique for induced strain ferroelectric loop study at low frequency |
publishDate |
2018 |
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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84904052484&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/45596 |
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