Characterization of a compact filament-driven multicusp ion source for low energy time-of-flight Rutherford backscattering spectrometry application
The characterization of materials by ion beam based Rutherford backscattering spectroscopy (RBS) was studied. It was found that a compact filament-driven multicusp ion source was used for the time-of-flight RBS applications. The use of beam width to deduce the beam emittance and measurement at beam...
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2014
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th-cmuir.6653943832-71752014-08-30T03:51:39Z Characterization of a compact filament-driven multicusp ion source for low energy time-of-flight Rutherford backscattering spectrometry application Dangtip S. Junphong P. Ano V. Lekprasert B. Suwannakachorn D. Thongnopparat N. Vilaithong T. The characterization of materials by ion beam based Rutherford backscattering spectroscopy (RBS) was studied. It was found that a compact filament-driven multicusp ion source was used for the time-of-flight RBS applications. The use of beam width to deduce the beam emittance and measurement at beam profile monitor was investigated. Results shows the beam size and the beam divergence at the entrance of the quadrupole magnet. 2014-08-30T03:51:39Z 2014-08-30T03:51:39Z 2004 Conference Paper 00346748 10.1063/1.1699464 RSINA http://www.scopus.com/inward/record.url?eid=2-s2.0-3042847010&partnerID=40&md5=67dc78452a59e8f4269e764b53d6c50d http://cmuir.cmu.ac.th/handle/6653943832/7175 English |
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The characterization of materials by ion beam based Rutherford backscattering spectroscopy (RBS) was studied. It was found that a compact filament-driven multicusp ion source was used for the time-of-flight RBS applications. The use of beam width to deduce the beam emittance and measurement at beam profile monitor was investigated. Results shows the beam size and the beam divergence at the entrance of the quadrupole magnet. |
format |
Conference or Workshop Item |
author |
Dangtip S. Junphong P. Ano V. Lekprasert B. Suwannakachorn D. Thongnopparat N. Vilaithong T. |
spellingShingle |
Dangtip S. Junphong P. Ano V. Lekprasert B. Suwannakachorn D. Thongnopparat N. Vilaithong T. Characterization of a compact filament-driven multicusp ion source for low energy time-of-flight Rutherford backscattering spectrometry application |
author_facet |
Dangtip S. Junphong P. Ano V. Lekprasert B. Suwannakachorn D. Thongnopparat N. Vilaithong T. |
author_sort |
Dangtip S. |
title |
Characterization of a compact filament-driven multicusp ion source for low energy time-of-flight Rutherford backscattering spectrometry application |
title_short |
Characterization of a compact filament-driven multicusp ion source for low energy time-of-flight Rutherford backscattering spectrometry application |
title_full |
Characterization of a compact filament-driven multicusp ion source for low energy time-of-flight Rutherford backscattering spectrometry application |
title_fullStr |
Characterization of a compact filament-driven multicusp ion source for low energy time-of-flight Rutherford backscattering spectrometry application |
title_full_unstemmed |
Characterization of a compact filament-driven multicusp ion source for low energy time-of-flight Rutherford backscattering spectrometry application |
title_sort |
characterization of a compact filament-driven multicusp ion source for low energy time-of-flight rutherford backscattering spectrometry application |
publishDate |
2014 |
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http://www.scopus.com/inward/record.url?eid=2-s2.0-3042847010&partnerID=40&md5=67dc78452a59e8f4269e764b53d6c50d http://cmuir.cmu.ac.th/handle/6653943832/7175 |
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1681420751388803072 |