Polarization phase-shifting technique for the determination of a transparent thin film’s thickness using a modified sagnac interferometer

• Main Authors: Rapeepan Kaewon, Chutchai Pawong, Ratchapak Chitaree, Apichai Bhatranand
• Other Authors: Rajamangala University of Technology system
• Format: Article
• Published: 2019
• Subjects: Physics and Astronomy
• Online Access: https://repository.li.mahidol.ac.th/handle/123456789/47373
• Institution: Mahidol University

© 2018 Current Optics and Photonics. We propose a polarization phase-shifting technique to investigate the thickness of Ta2O5 thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized b...