Polarization phase-shifting technique for the determination of a transparent thin film’s thickness using a modified sagnac interferometer
© 2018 Current Optics and Photonics. We propose a polarization phase-shifting technique to investigate the thickness of Ta2O5 thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized b...
Saved in:
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2019
|
| Subjects: | |
| Online Access: | https://repository.li.mahidol.ac.th/handle/123456789/47373 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Mahidol University |