Nanometer-scale displacement measurement using a simple diffraction grating with a quadrature detection technique

A phase-sensitive transparent grating interferometer is proposed to measure small displacements. A transparent grating is inserted between a light source and a reflective mirror. The diffracted light beams of the forward and backward propagation are superposed to form the interference pattern. When...

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Bibliographic Details
Main Author: Nuntakulkaisak T.
Other Authors: Mahidol University
Format: Article
Published: 2023
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Online Access:https://repository.li.mahidol.ac.th/handle/123456789/86913
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Institution: Mahidol University

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