Bimodal weibull distribution of metal/high-κ gate stack TDDB-insights by scanning tunneling microscopy

بواسطة Yew, K. S., Bersuker, G., Ang, Diing Shenp
منشور في 2013

Electron trap transformation under positive-bias temperature stressing

بواسطة Gao, Yuan, Ang, Diing Shenp, Bersuker, G., Young, C. D.
منشور في 2013

Evidence for the transformation of switching hole traps into permanent bulk traps under negative-bias temperature stressing of high-k P-MOSFETs

بواسطة Gao, Yuan, Ang, Diing Shenp, Young, C. D., Bersuker, G.
منشور في 2013

White-light-induced disruption of nanoscale conducting filament in hafnia

بواسطة Zhang, H. Z., Bersuker, G., Zhou, Y., Yew, Kwang Sing, Ang, Diing Shenp, Kawashima, Tomohito, Bera, Milan Kumar
منشور في 2015