Bimodal weibull distribution of metal/high-κ gate stack TDDB-insights by scanning tunneling microscopy

by Yew, K. S., Bersuker, G., Ang, Diing Shenp
Published 2013

Electron trap transformation under positive-bias temperature stressing

by Gao, Yuan, Ang, Diing Shenp, Bersuker, G., Young, C. D.
Published 2013

Evidence for the transformation of switching hole traps into permanent bulk traps under negative-bias temperature stressing of high-k P-MOSFETs

by Gao, Yuan, Ang, Diing Shenp, Young, C. D., Bersuker, G.
Published 2013

White-light-induced disruption of nanoscale conducting filament in hafnia

by Zhang, H. Z., Bersuker, G., Zhou, Y., Yew, Kwang Sing, Ang, Diing Shenp, Kawashima, Tomohito, Bera, Milan Kumar
Published 2015