Bimodal weibull distribution of metal/high-κ gate stack TDDB-insights by scanning tunneling microscopy

由 Yew, K. S., Bersuker, G., Ang, Diing Shenp
出版 2013

Electron trap transformation under positive-bias temperature stressing

由 Gao, Yuan, Ang, Diing Shenp, Bersuker, G., Young, C. D.
出版 2013

Evidence for the transformation of switching hole traps into permanent bulk traps under negative-bias temperature stressing of high-k P-MOSFETs

由 Gao, Yuan, Ang, Diing Shenp, Young, C. D., Bersuker, G.
出版 2013

White-light-induced disruption of nanoscale conducting filament in hafnia

由 Zhang, H. Z., Bersuker, G., Zhou, Y., Yew, Kwang Sing, Ang, Diing Shenp, Kawashima, Tomohito, Bera, Milan Kumar
出版 2015