Microemulsion processing of manganese zinc ferrites

by Wang, J., Chong, P.F., Ng, S.C., Gan, L.M.
Published 2014

Effects of electron-beam lithography on thin gate oxide reliability

by Chong, P.F., Cho, B.J., Chor, E.F., Joo, M.S.
Published 2014

Investigation of reliability degradation of ultra-thin gate oxides irradiated under electron-beam lithography conditions

by Chong, P.F., Cho, B.J., Chor, E.F., Joo, M.S., Yeo, I.S.
Published 2014

Electron-beam irradiation-induced gate oxide degradation

by Cho, B.J., Chong, P.F., Chor, E.F., Joo, M.S., Yeo, I.S.
Published 2014

Does short wavelength lithography process degrade the integrity of thin gate oxide?

by Kim, S.J., Cho, B.J., Chong, P.F., Chor, E.F., Ang, C.H., Ling, C.H., Joo, M.S., Yeo, I.S.
Published 2014