Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs

بواسطة Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
منشور في 2014

Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs

بواسطة Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
منشور في 2014

Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate

بواسطة Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
منشور في 2014

A new DC drain-current-conductance method (DCCM) for the characterization of effective mobilty (ueff) and series resistances (Rs, Rd) of fresh and hot-carrier stressed graded junct...

بواسطة Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
منشور في 2014

A novel single-device DC method for extraction of the effective mobility and source-drain resistances of fresh and hot-carrier degraded drain-engineered MOSFET's

بواسطة Lou, C.-L., Chim, W.-K., Chan, D.S.-H., Pan, Y.
منشور في 2014

Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses

بواسطة Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
منشور في 2014

Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs

بواسطة Lou, C.L., Qin, W.H., Chim, W.K., Chan, D.S.H.
منشور في 2014

Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing

بواسطة Oh, G.G., Chim, W.K., Chan, D.S.H., Lou, C.L.
منشور في 2014

Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device

بواسطة Lou, C.L., Tan, C.B., Chim, W.K., Chan, D.S.H.
منشور في 2014

An improved drain-current-conductance method with substrate back-biasing

بواسطة Tan, C.B., Chim, W.K., Chan, D.S.H., Lou, C.L.
منشور في 2014

Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing

بواسطة Qin, W.H., Chim, W.K., Chan, D.S.H., Lou, C.L.
منشور في 2014

Characterization of the plasma-induced effective mobility degradation of LATID NMOSFETs

بواسطة Lou, C.L., Song, J., Tan, C.B., Chim, W.K., Chan, D.S.H., Pan, Y.
منشور في 2014

Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure

بواسطة Jie, B.B., Li, M.F., Lou, C.L., Lo, K.F., Chim, W.K., Chan, D.S.H.
منشور في 2014

Investigation of interface traps in LDD pMOST's by the DCIV method

بواسطة Jie, B.B., Li, M.F., Lou, C.L., Chim, W.K., Chan, D.S.H., Lo, K.F.
منشور في 2014

Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy

بواسطة Chim, W.K., Chan, D.S.H., Tao, J.M., Lou, C.L., Leang, S.E., Teow, C.K.
منشور في 2014

Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis

بواسطة Ng, T.H., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y., Lou, C.L., Leang, S.E., Tao, J.M.
منشور في 2014