Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs

由 Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
出版 2014

Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs

由 Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
出版 2014

Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate

由 Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
出版 2014

A new DC drain-current-conductance method (DCCM) for the characterization of effective mobilty (ueff) and series resistances (Rs, Rd) of fresh and hot-carrier stressed graded junct...

由 Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
出版 2014

A novel single-device DC method for extraction of the effective mobility and source-drain resistances of fresh and hot-carrier degraded drain-engineered MOSFET's

由 Lou, C.-L., Chim, W.-K., Chan, D.S.-H., Pan, Y.
出版 2014

Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses

由 Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
出版 2014

Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs

由 Lou, C.L., Qin, W.H., Chim, W.K., Chan, D.S.H.
出版 2014

Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing

由 Oh, G.G., Chim, W.K., Chan, D.S.H., Lou, C.L.
出版 2014

Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device

由 Lou, C.L., Tan, C.B., Chim, W.K., Chan, D.S.H.
出版 2014

An improved drain-current-conductance method with substrate back-biasing

由 Tan, C.B., Chim, W.K., Chan, D.S.H., Lou, C.L.
出版 2014

Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing

由 Qin, W.H., Chim, W.K., Chan, D.S.H., Lou, C.L.
出版 2014

Characterization of the plasma-induced effective mobility degradation of LATID NMOSFETs

由 Lou, C.L., Song, J., Tan, C.B., Chim, W.K., Chan, D.S.H., Pan, Y.
出版 2014

Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure

由 Jie, B.B., Li, M.F., Lou, C.L., Lo, K.F., Chim, W.K., Chan, D.S.H.
出版 2014

Investigation of interface traps in LDD pMOST's by the DCIV method

由 Jie, B.B., Li, M.F., Lou, C.L., Chim, W.K., Chan, D.S.H., Lo, K.F.
出版 2014

Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy

由 Chim, W.K., Chan, D.S.H., Tao, J.M., Lou, C.L., Leang, S.E., Teow, C.K.
出版 2014

Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis

由 Ng, T.H., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y., Lou, C.L., Leang, S.E., Tao, J.M.
出版 2014