A review of curve fitting error criteria for solar cell I-V characteristics

by Phang, J.C.H., Chan, D.S.H.
Published 2014

Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

by Kolachina, S., Phang, J.C.H., Chan, D.S.H.
Published 2014

A portable scanning electron microscope column design based on the use of permanent magnets

by Khursheed, A., Phang, J.C., Thong, J.T.L.
Published 2014

Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

by Kolachina, S., Phang, J.C.H., Chan, D.S.H.
Published 2014

Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images

by Sim, K.S., Thong, J.T.L., Phang, J.C.H.
Published 2014

Single-image signal-to-noise ratio estimation

by Thong, J.T.L., Sim, K.S., Phang, J.C.H.
Published 2014

Automatic DRAM cell location in the SEM

by Thong, J.T.L., Zhu, Y., Phang, J.C.H.
Published 2014

Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy

by Meng, L., Street, A.G., Phang, J.C.H.
Published 2014

Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam tester

by Sim, K.S., Phang, J.C.H., Chan, D.S.H.
Published 2014

Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester

by Phang, J.C.H., Sim, K.S., Chan, D.S.H.
Published 2014

Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscope

by Wong, W.K., Phang, J.C.H., Thong, J.T.L.
Published 2014

Experimentally observed deviations from the superposition principle in crystalline silicon solar cells at low illuminations

by Chan, D.S.H., Phang, J.C.H., Wong, H.W.
Published 2014

Factors governing the discharge of electrostatic mirror formations in the scanning electron microscope

by Wong, W.K., Thong, J.T.L., Phang, J.C.H.
Published 2014

A robust focusing and astigmatism correction method for the scanning electron microscope

by Ong, K.H., Phang, J.C.H., Thong, J.T.L.
Published 2014

A robust focusing and astigmatism correction method for the scanning electron microscope - Part II: Autocorrelation-based coarse focusing method

by Ong, K.H., Phang, J.C.H., Thong, J.T.L.
Published 2014

A robust focusing and astigmatism correction method for the scanning electron microscope - Part III: An improved technique

by Ong, K.H., Phang, J.C.H., Thong, J.T.L.
Published 2014

A novel method for the discharge of electrostatic mirror formations in the scanning electron microscope

by Wong, W.K., Phang, J.C.H., Thong, J.T.L.
Published 2014

Automatic integrated circuit die positioning in the scanning electron microscope

by Tan, H.W., Phang, J.C.H., Thong, J.T.L.
Published 2014

A comparative study of extraction methods for solar cell model parameters

by Chan, D.S.H., Phillips, J.R., Phang, J.C.H.
Published 2014

Determination of the local electric field strength near electric breakdown

by Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Published 2014