Self-heating-induced spatial spread of interface state generation by hot-electron effect: Role of the high-energy tail electron

by Ang, D.S., Phua, T.W.H., Ling, C.H.
Published 2014

Evidence for a composite interface state generation mode in the CHE-stressed deep-submicrometer n-MOSFET

by Ang, D.S., Liao, H., Phua, T.W.H., Ling, C.H.
Published 2014

High-energy tail electrons as the mechanism for the worst-case hot-carrier stress degradation of the deep submicrometer N-MOSFET

by Ang, D.S., Phua, T.W.H., Liao, H., Ling, C.H.
Published 2014