Electrical characterization of the novel vertical slit field-effect transistor (VeSFET)

由 Tung, Zhi Yan.
出版 2012

Bias temperature instability study on switching defects in SiON and high-K gate dielectrics

由 Tung, Zhi Yan
出版 2019

Impact of voltage-accelerated stress on hole trapping at operating condition

由 Tung, Zhi Yan, Ang, Diing Shenp
出版 2018

New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing

由 Boo, Ann Ann, Tung, Zhi Yan, Ang, Diing Shenp
出版 2018