#TITLE_ALTERNATIVE#
Determining the thickness and refractive index multiple layer with analysis of attenuated total reflectance curve by curve fitting of Winspall software. Measurement of thickness and refractive index of multilayer can be made by the reflection method. Measurement techniques used in this thesis is to...
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| Format: | Final Project |
| Language: | Indonesia |
| Online Access: | https://digilib.itb.ac.id/gdl/view/16667 |
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| Institution: | Institut Teknologi Bandung |
| Language: | Indonesia |