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Determining the thickness and refractive index multiple layer with analysis of attenuated total reflectance curve by curve fitting of Winspall software. Measurement of thickness and refractive index of multilayer can be made by the reflection method. Measurement techniques used in this thesis is to...
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主要作者: | (NIM : 10205007); Pembimbing : Dr. Hendro, NATAL |
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格式: | Final Project |
語言: | Indonesia |
在線閱讀: | https://digilib.itb.ac.id/gdl/view/16667 |
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機構: | Institut Teknologi Bandung |
語言: | Indonesia |
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