STUDI PENGARUH LAPISAN PENYANGGA TERHADAP KUALITAS FILM TIPIS GAN DITUMBUHKAN DENGAN METODE MOCVD BERBANTUAN PLASMA

<b>Abstract :</b><p align=\"justify\">The effect of the buffer layer thickness on GaN film which was grown by plasma-assisted metalorganic chemical vapor deposition (PAMOCVD) technique have been investigated. The buffer layer thickness were varied from 0 to 400 A. The GaN...

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Main Author: S. Hasan , Erzam
Format: Theses
Language:Indonesia
Online Access:https://digilib.itb.ac.id/gdl/view/5075
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Institution: Institut Teknologi Bandung
Language: Indonesia
id id-itb.:5075
spelling id-itb.:50752006-04-12T14:28:29ZSTUDI PENGARUH LAPISAN PENYANGGA TERHADAP KUALITAS FILM TIPIS GAN DITUMBUHKAN DENGAN METODE MOCVD BERBANTUAN PLASMA S. Hasan , Erzam Indonesia Theses INSTITUT TEKNOLOGI BANDUNG https://digilib.itb.ac.id/gdl/view/5075 <b>Abstract :</b><p align=\"justify\">The effect of the buffer layer thickness on GaN film which was grown by plasma-assisted metalorganic chemical vapor deposition (PAMOCVD) technique have been investigated. The buffer layer thickness were varied from 0 to 400 A. The GaN film grown without buffer layer has a mixture of crystallites oriented along (0002), (10-1 1) and (1120)and the films with buffer layer tend to have a single orientation (0002). The buffer layer improved the crystalline quality, morphology and Hall mobility of films. The optimum conditions of GaN films were taken on the GaN buffer layer thickness of 260 A. text
institution Institut Teknologi Bandung
building Institut Teknologi Bandung Library
continent Asia
country Indonesia
Indonesia
content_provider Institut Teknologi Bandung
collection Digital ITB
language Indonesia
description <b>Abstract :</b><p align=\"justify\">The effect of the buffer layer thickness on GaN film which was grown by plasma-assisted metalorganic chemical vapor deposition (PAMOCVD) technique have been investigated. The buffer layer thickness were varied from 0 to 400 A. The GaN film grown without buffer layer has a mixture of crystallites oriented along (0002), (10-1 1) and (1120)and the films with buffer layer tend to have a single orientation (0002). The buffer layer improved the crystalline quality, morphology and Hall mobility of films. The optimum conditions of GaN films were taken on the GaN buffer layer thickness of 260 A.
format Theses
author S. Hasan , Erzam
spellingShingle S. Hasan , Erzam
STUDI PENGARUH LAPISAN PENYANGGA TERHADAP KUALITAS FILM TIPIS GAN DITUMBUHKAN DENGAN METODE MOCVD BERBANTUAN PLASMA
author_facet S. Hasan , Erzam
author_sort S. Hasan , Erzam
title STUDI PENGARUH LAPISAN PENYANGGA TERHADAP KUALITAS FILM TIPIS GAN DITUMBUHKAN DENGAN METODE MOCVD BERBANTUAN PLASMA
title_short STUDI PENGARUH LAPISAN PENYANGGA TERHADAP KUALITAS FILM TIPIS GAN DITUMBUHKAN DENGAN METODE MOCVD BERBANTUAN PLASMA
title_full STUDI PENGARUH LAPISAN PENYANGGA TERHADAP KUALITAS FILM TIPIS GAN DITUMBUHKAN DENGAN METODE MOCVD BERBANTUAN PLASMA
title_fullStr STUDI PENGARUH LAPISAN PENYANGGA TERHADAP KUALITAS FILM TIPIS GAN DITUMBUHKAN DENGAN METODE MOCVD BERBANTUAN PLASMA
title_full_unstemmed STUDI PENGARUH LAPISAN PENYANGGA TERHADAP KUALITAS FILM TIPIS GAN DITUMBUHKAN DENGAN METODE MOCVD BERBANTUAN PLASMA
title_sort studi pengaruh lapisan penyangga terhadap kualitas film tipis gan ditumbuhkan dengan metode mocvd berbantuan plasma
url https://digilib.itb.ac.id/gdl/view/5075
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