CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
Introduction and Motivation -- SRAM Circuit Design and Operation -- SRAM Cell Stability: Definition, Modeling and Testing -- Traditional SRAM Fault Models and Test Practices -- Techniques for Detection of SRAM Cells with Stability Faults -- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Te...
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| Main Authors: | , |
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| 格式: | 圖書 |
| 語言: | English |
| 出版: |
Springer
2017
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| 主題: | |
| 在線閱讀: | http://repository.vnu.edu.vn/handle/VNU_123/27331 http://dx.doi.org/10.1007/978-1-4020-8363-1 |
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| 機構: | Vietnam National University, Hanoi |
| 語言: | English |
| 總結: | Introduction and Motivation -- SRAM Circuit Design and Operation -- SRAM Cell Stability: Definition, Modeling and Testing -- Traditional SRAM Fault Models and Test Practices -- Techniques for Detection of SRAM Cells with Stability Faults -- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques. |
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