CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
Introduction and Motivation -- SRAM Circuit Design and Operation -- SRAM Cell Stability: Definition, Modeling and Testing -- Traditional SRAM Fault Models and Test Practices -- Techniques for Detection of SRAM Cells with Stability Faults -- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Te...
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Main Authors: | Pavlov, Andrei, Sachdev, Manoj. |
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Format: | Book |
Language: | English |
Published: |
Springer
2017
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Subjects: | |
Online Access: | http://repository.vnu.edu.vn/handle/VNU_123/27331 http://dx.doi.org/10.1007/978-1-4020-8363-1 |
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Institution: | Vietnam National University, Hanoi |
Language: | English |
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