Bridge-Defect Prediction in SRAM Circuits Using Random Forest, XGBoost, and LightGBM Learners

Bridge-Defect Prediction in SRAM Circuits Using Random Forest, XGBoost, and LightGBM Learners

10.1109/SISPAD54002.2021.9592539

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Bibliographic Details
Main Authors: Joydeep Ghosh, Shang Yi Lim, Aaron Voon-Yew Thean
Other Authors: DEAN'S OFFICE (ENGINEERING)
Format: Article
Language:English
Published: IEEE 2023
Subjects:
Failure analysis
6T-SRAM
Random Forest
XGBoost
LightGBM
Online Access:https://scholarbank.nus.edu.sg/handle/10635/238263
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Institution: National University of Singapore
Language: English

Internet

https://scholarbank.nus.edu.sg/handle/10635/238263

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