Bridge-Defect Prediction in SRAM Circuits Using Random Forest, XGBoost, and LightGBM Learners
10.1109/SISPAD54002.2021.9592539
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Main Authors: | Joydeep Ghosh, Shang Yi Lim, Aaron Voon-Yew Thean |
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Other Authors: | DEAN'S OFFICE (ENGINEERING) |
Format: | Article |
Language: | English |
Published: |
IEEE
2023
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Subjects: | |
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/238263 |
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Institution: | National University of Singapore |
Language: | English |
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