Descrambling of embedded SRAM using a laser probe

• Main Authors: Chef, Samuel, Chua, Chung Tah, Tay, Jing Yun, Siah, Yu Wen, Bhasin, Shivam, Breier, J., Gan, Chee Lip
• Other Authors: School of Materials Science & Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2019
• Subjects: Random Access Memory; Transistors; Engineering::Materials
• Online Access: https://hdl.handle.net/10356/107598; http://hdl.handle.net/10220/50353
• Institution: Nanyang Technological University

Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for conte...