Descrambling of embedded SRAM using a laser probe
Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for conte...
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sg-ntu-dr.10356-1075982020-09-26T22:15:28Z Descrambling of embedded SRAM using a laser probe Chef, Samuel Chua, Chung Tah Tay, Jing Yun Siah, Yu Wen Bhasin, Shivam Breier, J. Gan, Chee Lip School of Materials Science & Engineering 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Temasek Laboratories Random Access Memory Transistors Engineering::Materials Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for content estimation or encryption key recovery, with several techniques being reported for this task. In this paper, we discuss the application of laser probing for descrambling memory embedded in 8 bits microcontrollers designed and manufactured by different companies in various technology nodes. Accepted version 2019-11-06T09:19:36Z 2019-12-06T22:35:23Z 2019-11-06T09:19:36Z 2019-12-06T22:35:23Z 2018 Conference Paper Chef, S., Chua, C. T., Tay, J. Y., Siah, Y. W., Bhasin, S., Breier, J., & Gan, C. L. (2018). Descrambling of embedded SRAM using a laser probe. 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). doi:10.1109/IPFA.2018.8452604 https://hdl.handle.net/10356/107598 http://hdl.handle.net/10220/50353 10.1109/IPFA.2018.8452604 en © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/IPFA.2018.8452604 6 p. application/pdf |
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Random Access Memory Transistors Engineering::Materials |
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Random Access Memory Transistors Engineering::Materials Chef, Samuel Chua, Chung Tah Tay, Jing Yun Siah, Yu Wen Bhasin, Shivam Breier, J. Gan, Chee Lip Descrambling of embedded SRAM using a laser probe |
| description |
Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for content estimation or encryption key recovery, with several techniques being reported for this task. In this paper, we discuss the application of laser probing for descrambling memory embedded in 8 bits microcontrollers designed and manufactured by different companies in various technology nodes. |
| author2 |
School of Materials Science & Engineering |
| author_facet |
School of Materials Science & Engineering Chef, Samuel Chua, Chung Tah Tay, Jing Yun Siah, Yu Wen Bhasin, Shivam Breier, J. Gan, Chee Lip |
| format |
Conference or Workshop Item |
| author |
Chef, Samuel Chua, Chung Tah Tay, Jing Yun Siah, Yu Wen Bhasin, Shivam Breier, J. Gan, Chee Lip |
| author_sort |
Chef, Samuel |
| title |
Descrambling of embedded SRAM using a laser probe |
| title_short |
Descrambling of embedded SRAM using a laser probe |
| title_full |
Descrambling of embedded SRAM using a laser probe |
| title_fullStr |
Descrambling of embedded SRAM using a laser probe |
| title_full_unstemmed |
Descrambling of embedded SRAM using a laser probe |
| title_sort |
descrambling of embedded sram using a laser probe |
| publishDate |
2019 |
| url |
https://hdl.handle.net/10356/107598 http://hdl.handle.net/10220/50353 |
| _version_ |
1681057688742526976 |