Design, Automation, and Test in Europe

The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent histo...

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Other Authors: Lauwereins, Rudy
Format: Book
Language:English
Published: Design 2017
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Online Access:http://repository.vnu.edu.vn/handle/VNU_123/30263
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Institution: Vietnam National University, Hanoi
Language: English
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spelling oai:112.137.131.14:VNU_123-302632020-05-13T01:41:09Z Design, Automation, and Test in Europe Lauwereins, Rudy Madsen, Jan (Eds.) Engineering Europe Automation The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry. The papers were grouped in six sections: System Level Design; Networks on Chip; Modeling, Simulation and Run-Time Management; Digital Systems in CMOS and Beyond; Physical Design and Validation; and Test and Verification. The winners of the prestigious EDAA Lifetime Achievement Award as well as other recognized experts in their field wrote an introduction to each section, summarizing the history in their domain and indicating how the selected DATE papers contributed to it. 2017-04-18T01:51:49Z 2017-04-18T01:51:49Z 2008 Book 978-1-4020-6487-6 http://repository.vnu.edu.vn/handle/VNU_123/30263 en 499 p. application/pdf Design
institution Vietnam National University, Hanoi
building VNU Library & Information Center
country Vietnam
collection VNU Digital Repository
language English
topic Engineering
Europe
Automation
spellingShingle Engineering
Europe
Automation
Design, Automation, and Test in Europe
description The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry. The papers were grouped in six sections: System Level Design; Networks on Chip; Modeling, Simulation and Run-Time Management; Digital Systems in CMOS and Beyond; Physical Design and Validation; and Test and Verification. The winners of the prestigious EDAA Lifetime Achievement Award as well as other recognized experts in their field wrote an introduction to each section, summarizing the history in their domain and indicating how the selected DATE papers contributed to it.
author2 Lauwereins, Rudy
author_facet Lauwereins, Rudy
format Book
title Design, Automation, and Test in Europe
title_short Design, Automation, and Test in Europe
title_full Design, Automation, and Test in Europe
title_fullStr Design, Automation, and Test in Europe
title_full_unstemmed Design, Automation, and Test in Europe
title_sort design, automation, and test in europe
publisher Design
publishDate 2017
url http://repository.vnu.edu.vn/handle/VNU_123/30263
_version_ 1680965365679521792