Design, Automation, and Test in Europe
The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent histo...
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Other Authors: | Lauwereins, Rudy |
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Format: | Book |
Language: | English |
Published: |
Design
2017
|
Subjects: | |
Online Access: | http://repository.vnu.edu.vn/handle/VNU_123/30263 |
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Institution: | Vietnam National University, Hanoi |
Language: | English |
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