Design, Automation, and Test in Europe

The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent histo...

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Bibliographic Details
Other Authors: Lauwereins, Rudy
Format: Book
Language:English
Published: Design 2017
Subjects:
Online Access:http://repository.vnu.edu.vn/handle/VNU_123/30263
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Institution: Vietnam National University, Hanoi
Language: English
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