Design, Automation, and Test in Europe

The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent histo...

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書目詳細資料
其他作者: Lauwereins, Rudy
格式: 圖書
語言:English
出版: Design 2017
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在線閱讀:http://repository.vnu.edu.vn/handle/VNU_123/30263
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