Application of Bond-valence Modelling Method for Illustration of Point Defects in Semiconductors

Point defects in semiconductors cause many considerable behaviours of these materials. This article introduces a procedure for modelling of point defects using a structural approach often referred to as a bond-valence method. This method minimalizes the computation cost and facilitates a contruction...

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主要作者: Hoang, Nam Nhat
格式: Article
語言:English
出版: H. : ĐHQGHN 2018
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在線閱讀:http://repository.vnu.edu.vn/handle/VNU_123/62915
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機構: Vietnam National University, Hanoi
語言: English