Application of Bond-valence Modelling Method for Illustration of Point Defects in Semiconductors
Point defects in semiconductors cause many considerable behaviours of these materials. This article introduces a procedure for modelling of point defects using a structural approach often referred to as a bond-valence method. This method minimalizes the computation cost and facilitates a contruction...
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| 格式: | Article |
| 語言: | English |
| 出版: |
H. : ĐHQGHN
2018
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| 主題: | |
| 在線閱讀: | http://repository.vnu.edu.vn/handle/VNU_123/62915 |
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| 機構: | Vietnam National University, Hanoi |
| 語言: | English |