Characterization of spin coated YSZ thin films by Raman spectroscopy, x-ray diffraction and scanning electron microscopy

• Main Author: Mendiola, Simon Gerard G.
• Format: text
• Language: English
• Published: Animo Repository 2010
• Subjects: Physics
• Online Access: https://animorepository.dlsu.edu.ph/etd_bachelors/2551
• Institution: De La Salle University

Yttria Stabilized Zirconia (YSZ) thin films (<10 >um) were fabricated by spin coating technique on three different substrates namely, silicon (Si), silica (SiO2) and steel (Fe/ Cr18 Ni10). Parameters such asd sintering temperature, thickness of the YSZ films, kind of substrates and concentration ratio of YSZ powder to solvent were varied accordingly. The effects of these variations were investigated and discussed. Using X-ray Diffraction and Raman Spectroscopy, the crystal structure of the samples were determined. The 8-YSZ thin films have cubic fluorite structure. The X-ray diffraction patterns were in agreement with the samples Raman spectra. The X-ray diffraction patterns were in agreement with the samples Raman spectra. In the case of the 30ysc: 70ethanol YSZ thin film on steel substrate, the Raman and XRD peaks shifted because of the stress-strain interaction between the steel and the YSZ thin film. Pores were evident on single coated substrates but were minimized using higher YSZ concentration.