Characterization of spin coated YSZ thin films by Raman spectroscopy, x-ray diffraction and scanning electron microscopy
Yttria Stabilized Zirconia (YSZ) thin films (<10 >um) were fabricated by spin coating technique on three different substrates namely, silicon (Si), silica (SiO2) and steel (Fe/ Cr18 Ni10). Parameters such asd sintering temperature, thickness of the YSZ films, kind of substrates and concentrati...
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2010
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| 機構: | De La Salle University |
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