Characterization of spin coated YSZ thin films by Raman spectroscopy, x-ray diffraction and scanning electron microscopy
Yttria Stabilized Zirconia (YSZ) thin films (<10 >um) were fabricated by spin coating technique on three different substrates namely, silicon (Si), silica (SiO2) and steel (Fe/ Cr18 Ni10). Parameters such asd sintering temperature, thickness of the YSZ films, kind of substrates and concentrati...
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| Format: | text |
| Language: | English |
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Animo Repository
2010
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| Online Access: | https://animorepository.dlsu.edu.ph/etd_bachelors/2551 |
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| Institution: | De La Salle University |
| Language: | English |