$Characterization of spin coated YSZ thin films by Raman spectroscopy, x-ray diffraction and scanning electron microscopy$

Characterization of spin coated YSZ thin films by Raman spectroscopy, x-ray diffraction and scanning electron microscopy

Yttria Stabilized Zirconia (YSZ) thin films (<10 >um) were fabricated by spin coating technique on three different substrates namely, silicon (Si), silica (SiO2) and steel (Fe/ Cr18 Ni10). Parameters such asd sintering temperature, thickness of the YSZ films, kind of substrates and concentrati...

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書目詳細資料
主要作者:	Mendiola, Simon Gerard G.
格式:	text
語言:	English
出版:	Animo Repository 2010
主題:	Physics
在線閱讀:	https://animorepository.dlsu.edu.ph/etd_bachelors/2551
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	De La Salle University
語言:	English

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