Characterization of fabricated polythiophene thin films by transverse R-T, sem and FTIR

Characterization of fabricated samples of PT films were done using transverse resistance measurement, i.e. resistance measured normal to the surface of the films, from 80-303 Kelvin, SEM for surface morphology observation and FTIR for IR-spectra studies. Results show that samples three and four exhi...

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Bibliographic Details
Main Authors: Lumpan, Kevin L., Torralba, Rodel C.
Format: text
Language:English
Published: Animo Repository 1998
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Online Access:https://animorepository.dlsu.edu.ph/etd_bachelors/4501
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Institution: De La Salle University
Language: English