Characterization of fabricated polythiophene thin films by transverse R-T, sem and FTIR
Characterization of fabricated samples of PT films were done using transverse resistance measurement, i.e. resistance measured normal to the surface of the films, from 80-303 Kelvin, SEM for surface morphology observation and FTIR for IR-spectra studies. Results show that samples three and four exhi...
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Main Authors: | , |
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Format: | text |
Language: | English |
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Animo Repository
1998
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Subjects: | |
Online Access: | https://animorepository.dlsu.edu.ph/etd_bachelors/4501 |
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Institution: | De La Salle University |
Language: | English |