Characterization of fabricated polythiophene thin films by transverse R-T, sem and FTIR

• المؤلفون الرئيسيون: Lumpan, Kevin L., Torralba, Rodel C.
• التنسيق: text
• اللغة: English
• منشور في: Animo Repository 1998
• الموضوعات: Semiconductor films; Thin films; Polymers; Electrochemistry; Inorganic compounds > Synthesis; Thiophenes—Spectra; Physics
• الوصول للمادة أونلاين: https://animorepository.dlsu.edu.ph/etd_bachelors/4501

Characterization of fabricated samples of PT films were done using transverse resistance measurement, i.e. resistance measured normal to the surface of the films, from 80-303 Kelvin, SEM for surface morphology observation and FTIR for IR-spectra studies. Results show that samples three and four exhi...