Computer vision: As applied to defective IC-die attachment detection

The COMPUTER VISION system is a prototype designed to evaluate the quality of attachment between IC dies and its corresponding lead frames. Evaluation is based on five criteria. The prototype is comprised of a hardware component and a software module. The hardware is divided into seven significant p...

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Bibliographic Details
Main Authors: Alba, Faye Reyes, Chua, Giselle Go, Francisco, Ronald Aquino, Rubia, Reuben Castro
Format: text
Language:English
Published: Animo Repository 1992
Subjects:
Online Access:https://animorepository.dlsu.edu.ph/etd_bachelors/7038
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Institution: De La Salle University
Language: English