Computer vision: As applied to defective IC-die attachment detection
The COMPUTER VISION system is a prototype designed to evaluate the quality of attachment between IC dies and its corresponding lead frames. Evaluation is based on five criteria. The prototype is comprised of a hardware component and a software module. The hardware is divided into seven significant p...
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| Main Authors: | , , , |
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| Format: | text |
| Language: | English |
| Published: |
Animo Repository
1992
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| Subjects: | |
| Online Access: | https://animorepository.dlsu.edu.ph/etd_bachelors/7038 |
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| Institution: | De La Salle University |
| Language: | English |