Nanoscale contact charging of MoS2 by atomic force microscope

Nanoscale contact charging of MoS2 by atomic force microscope

Contact Electrification of MoS2 at nanometer level was demonstrated using a tapping mode Atomic Force Microscope or AFM. A highly doped n-type Si tip, d.c. biased from 0 to ±2V with a resonant frequency of 300kHz and a fixed amplitude set-point amplitude of 20nm, was used to generate contact electri...

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Bibliographic Details
Main Authors: Esmeria, Jose M., Jr, Lacuesta, Terencio, Pobre, Romeric F.
Format: text
Published: Animo Repository 2020
Subjects:
Molybdenum disulfide
Surface discharges (Electricity)
Nanoelectronics
Atomic force microscopy
Physical Sciences and Mathematics
Physics
Online Access:https://animorepository.dlsu.edu.ph/faculty_research/11760
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Institution: De La Salle University
Description
Summary:Contact Electrification of MoS2 at nanometer level was demonstrated using a tapping mode Atomic Force Microscope or AFM. A highly doped n-type Si tip, d.c. biased from 0 to ±2V with a resonant frequency of 300kHz and a fixed amplitude set-point amplitude of 20nm, was used to generate contact electrification on the surface of 5mm x 3mm MoS2 sample. Using the Kelvin Probe Force Microscope or KPFM, the surface potential images were shown to have bipolar charging and the surface charge affinity is more influenced by the positive bias voltage

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