Nanoscale contact charging of MoS2 by atomic force microscope
Contact Electrification of MoS2 at nanometer level was demonstrated using a tapping mode Atomic Force Microscope or AFM. A highly doped n-type Si tip, d.c. biased from 0 to ±2V with a resonant frequency of 300kHz and a fixed amplitude set-point amplitude of 20nm, was used to generate contact electri...
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2020
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oai:animorepository.dlsu.edu.ph:faculty_research-98102024-04-25T02:51:40Z Nanoscale contact charging of MoS2 by atomic force microscope Esmeria, Jose M., Jr Lacuesta, Terencio Pobre, Romeric F. Contact Electrification of MoS2 at nanometer level was demonstrated using a tapping mode Atomic Force Microscope or AFM. A highly doped n-type Si tip, d.c. biased from 0 to ±2V with a resonant frequency of 300kHz and a fixed amplitude set-point amplitude of 20nm, was used to generate contact electrification on the surface of 5mm x 3mm MoS2 sample. Using the Kelvin Probe Force Microscope or KPFM, the surface potential images were shown to have bipolar charging and the surface charge affinity is more influenced by the positive bias voltage 2020-10-01T07:00:00Z text https://animorepository.dlsu.edu.ph/faculty_research/11760 Faculty Research Work Animo Repository Molybdenum disulfide Surface discharges (Electricity) Nanoelectronics Atomic force microscopy Physical Sciences and Mathematics Physics |
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Molybdenum disulfide Surface discharges (Electricity) Nanoelectronics Atomic force microscopy Physical Sciences and Mathematics Physics |
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Molybdenum disulfide Surface discharges (Electricity) Nanoelectronics Atomic force microscopy Physical Sciences and Mathematics Physics Esmeria, Jose M., Jr Lacuesta, Terencio Pobre, Romeric F. Nanoscale contact charging of MoS2 by atomic force microscope |
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Contact Electrification of MoS2 at nanometer level was demonstrated using a tapping mode Atomic Force Microscope or AFM. A highly doped n-type Si tip, d.c. biased from 0 to ±2V with a resonant frequency of 300kHz and a fixed amplitude set-point amplitude of 20nm, was used to generate contact electrification on the surface of 5mm x 3mm MoS2 sample. Using the Kelvin Probe Force Microscope or KPFM, the surface potential images were shown to have bipolar charging and the surface charge affinity is more influenced by the positive bias voltage |
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text |
| author |
Esmeria, Jose M., Jr Lacuesta, Terencio Pobre, Romeric F. |
| author_facet |
Esmeria, Jose M., Jr Lacuesta, Terencio Pobre, Romeric F. |
| author_sort |
Esmeria, Jose M., Jr |
| title |
Nanoscale contact charging of MoS2 by atomic force microscope |
| title_short |
Nanoscale contact charging of MoS2 by atomic force microscope |
| title_full |
Nanoscale contact charging of MoS2 by atomic force microscope |
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Nanoscale contact charging of MoS2 by atomic force microscope |
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Nanoscale contact charging of MoS2 by atomic force microscope |
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nanoscale contact charging of mos2 by atomic force microscope |
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Animo Repository |
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2020 |
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https://animorepository.dlsu.edu.ph/faculty_research/11760 |
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