Nanoscale contact charging of MoS2 by atomic force microscope
Contact Electrification of MoS2 at nanometer level was demonstrated using a tapping mode Atomic Force Microscope or AFM. A highly doped n-type Si tip, d.c. biased from 0 to ±2V with a resonant frequency of 300kHz and a fixed amplitude set-point amplitude of 20nm, was used to generate contact electri...
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| Main Authors: | , , |
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| Format: | text |
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Animo Repository
2020
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| Subjects: | |
| Online Access: | https://animorepository.dlsu.edu.ph/faculty_research/11760 |
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| Institution: | De La Salle University |