Nanoscale contact charging of MoS2 by atomic force microscope

• Main Authors: Esmeria, Jose M., Jr, Lacuesta, Terencio, Pobre, Romeric F.
• Format: text
• Published: Animo Repository 2020
• Subjects: Molybdenum disulfide; Surface discharges (Electricity); Nanoelectronics; Atomic force microscopy; Physical Sciences and Mathematics; Physics
• Online Access: https://animorepository.dlsu.edu.ph/faculty_research/11760
• Institution: De La Salle University

Contact Electrification of MoS2 at nanometer level was demonstrated using a tapping mode Atomic Force Microscope or AFM. A highly doped n-type Si tip, d.c. biased from 0 to ±2V with a resonant frequency of 300kHz and a fixed amplitude set-point amplitude of 20nm, was used to generate contact electri...