Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
The advancement in semiconductor circuit design, particularly its miniaturization has increased the circuit sensitivity to electrical stresses. To protect the circuits, transient voltage suppressor (TVS) diodes are used. This device must be tested with the use of a high-power tester that is capable...
Saved in:
Main Author: | Malabanan, Francis |
---|---|
Format: | text |
Published: |
Archīum Ateneo
2021
|
Subjects: | |
Online Access: | https://archium.ateneo.edu/theses-dissertations/474 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Ateneo De Manila University |
Similar Items
-
Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
by: Malabanan, Francis, et al.
Published: (2019) -
Interface Test Adapter (ITA) Design for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Cycle Time
by: Malabanan, Francis, et al.
Published: (2019) -
Monitoring of the Semiconductor Wirebond Ultrasonic Signal for Prediction of Corresponding Electrical Test Result
by: Haldos, Reymart Rio
Published: (2021) -
The Development and Validation of an Achievement Test on Science Process Skills for Grade 10 Biology Students
by: Lapuz, Karla Mae
Published: (2020) -
The Construction of a Reading Placement Test for Korean English Language Learners Using Linguistic Modification
by: Cruz, Jr., Isidro
Published: (2020)