CMOS-MEMS capacitive sensors for intra-cranial pressure monitoring : sensor fabrication & system design
Low-frequency variation of intracranial pressure (ICP) is a key indicator determining the successful outcome of a patient, subjected to traumatic brain injury (TBI). Post-trauma ICP increase can lead to fatal secondary injuries and hence continuous ICP monitoring would be an essential modality requi...
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Main Authors: | , , , , |
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Other Authors: | |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/100181 http://hdl.handle.net/10220/13608 |
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Institution: | Nanyang Technological University |
Language: | English |